Accelerated Life Testing of LightABLE 40G rugged embedded transceiver
LightABLE LH Series SR4 transceivers are currently being submitted to a “Lifetime Test” against MIL-STD-883J, method 1005, cond. D, June 2013.
The “Lifetime Test” is conducted on 3 units at a case temperature of 100 °C, 15 °C more than the recommended maximum operating temperature.
These units, plus 1 reference unit from the same lot, are tested following Reflex Photonics’ final production test procedure on all their channels.
Referencing tests were conducted at 250, 1000, and 1500 hours, and so far, no significant performance degradation was observed on the LightABLE units.
Results for the upcoming 2000 hours milestone are expected in the coming weeks.
Accelerated Life Testing
When products are exposed to temperature stresses in the field, Accelerated Life Testing is used to simulate product life. In order to accelerate aging, products are tested at temperatures above that of their normal operating temperature. Defects or failure that would only show up after many years in the field at normal operating temperatures can be detected in short times in an Accelerated Life Test.