Reflex Photonics demonstrates its LightABLE transceivers can drive older 100 µm fiber optic cables, extending aircraft life and reducing upgrade cost.

LightABLE optical transceiver delivers error-free operation at 10 Gbps with older 100 µm fiber thus, alleviating the need to replace the installed optical cables.

Reflex Photonics is proud to announce its LightABLE™ embedded optical module has demonstrated that it can directly drive 100 µm fiber optic cables commonly found in older aircraft, eliminating the need to re-cable the aircraft to achieve higher interconnect bandwidth.
New or upgraded sensors and computer systems offer great benefits to existing military and commercial aircraft but often necessitate interconnect bandwidth of 10 Gbps or more. Unfortunately, replacing older 100 µm optical fibers in aircraft to support this higher bandwidth can be prohibitively expensive. Reflex Photonics solved this problem by demonstrating its LightABLE optical transceiver delivers error-free operation at 10 Gbps with older 100 µm fiber thus, alleviating the need to replace the installed optical cables.
In addition, the LightABLE transceiver will operate with newer 50 µm fiber (OM3, OM4, or OM5) to deliver interconnect bandwidth well beyond 25 Gbps on distances up to 100 m.

Reflex Photonics develops and produces rugged high-speed optical transceivers for Military, Industrial, and Commercial communications. LightABLE is a chip size embedded optical transceiver capable of transmitting or receiving 150 Gbps over 12 parallel lanes in harsh environments where temperatures extremes of -57ºC to 125ºC is common. A unique feature of the LightABLE is its compatibility with low-cost mass production solder reflow processes. Optical modules in general will not survive solder reflow temperatures of 220ºC and must be either socketed or hand soldered. LightABLE reflow ability gives low assembly cost, strong attachment, low profile, and excellent signal integrity.

Gerald Persaud, Vice President of Business Development commented:

We are excited to demonstrate the flexibility of our LightABLE optical module by offering a simple but effective way to upgrade aircraft interconnect bandwidth with no change to the installed fiber plant. This is another example of LightABLE exceeding performance expectations.

Optical transceivers empower wafer defect review system and offer the most viable data transfer solution for advanced machine vision challenges.

Hiigh-speed optical transceivers offer the most flexible solution to the data transfer issues faced by scanning electron microscope (SEM)-based semiconductor defect review system and machine vision integrators.

Reflex Photononics’ high-speed optical transceivers offer the most flexible solution to the data transfer issues faced by scanning electron microscope (SEM)-based semiconductor defect review system and machine vision integrators.
These integrators are faced with the challenge of embedding sensors with high resolution and high frame rates. Furthermore, new intelligent machines with real-time adaptive process enabling more accurate defect classification, also rely on faster and better data transfer. These challenges cannot be met efficiently and reliably with copper-based data transfer solutions: for data integrity, link reliability, and error-free data transfer at rates superior to 10 Gbps, optical link becomes the only viable solution.
The LightABLE SR12 and the SNAP12 embedded transceivers are used to transfer up to 150 Gbps from SEM defect-review system sensor to the system microcontroller or computer. These optical components are tested to give BER under E-15 over -40 ºC to 100 ºC operating temperature range. Our transceivers offer maximum flexibility in terms of board mounting options and facilitate board design. In addition, our optical transceivers can also be used on the control path where they enable sending of control data to help complex process adapt in real time.

Guillaume Blanchette, PM at Reflex Photonics, adds.

The chipmakers defect review challenges are growing as processes move to smaller and smaller node technology like 10 nm and 7 nm. The ability to discriminate killer defect from viable defect rely more and more on high-end imaging techniques.
The sensor resolution and capture speed must increase at the same time to improve the machine throughput and keep capturing the smallest defect efficiently. Only optical interconnect can break the data transfer bottleneck of these advanced defect review systems and machine vision applications.

Reflex Photonics to attend ECOC 2017 expo

Reflex Photonics to attend ECOC Exhibition.

The ECOC Exhibition is the largest optical communications exhibition in Europe, held each September in a different European city, the event is the key meeting place for decision makers from across the fibre optic communications technology industry.
Now in its 22nd year, the exhibition now attracts over 5,000 decision makers from all around the world - bringing together manufacturers, suppliers and service providers to networking, gain insights on the latest developments, new products and trends in the industry.

Reflex Photonics to attend Space Tech Expo Europe

Reflex Photonics will be present at the Space Tech Expo Europe conference.

The free-to-attend Space Tech Expo & Conference is Europe's meeting place for space business, technology & innovation. The three-day trade fair will showcase the latest from technical designers, sub-system suppliers, manufacturers and components through the systems integrators for civil, military and commercial space.

The Expo will be held from October 24th to 26th in Bremen, Germany.

Reflex Photonics to attend CIOE 2017 exhibition

Reflex Photonics will be present at the China International Optoelectronic Expo conference.

CIOE - China International Optoelectronic Expo – one of the most influential events in Asia for optical communications industry professionals. Featured with over 1 500 industry manufacturers and 50 000 professional visitors, its` exhibits profile covers the whole optical communication industry chain including optical communications system equipment, optical modules and devices, optical fiber & cables, testing equipment, broadcasting and telecommunication accessories.
The exhibition will be held on September 6-9 in Shenzhen.

Reflex Photonics to attend Defence and Security Equipment International (DSEI) exhibition

Reflex Photonics will be present at the Defence and Security Equipment International (DSEI) conference.
Defence and Security Equipment International (DSEI) is the world leading event that brings together the global defence and security sector to innovate and share knowledge. DSEI represents the entire supply chain on an unrivalled scale.
DSEI 2017 will have five key sector-focused Zones: Air, Land, Naval, Security & Joint, all showcasing the latest equipment and systems.

The DSEI Strategic Conferences take place on 11 September (Day Zero) with the main exhibition and free seminar programme running for four days from 12-15 September 2017, ExCeL, London.

Reflex Photonics launches a line of Optical Testers to simplify testing of its LightABLE rugged transceivers and of optical interconnects.

The Optical Testers are the perfect vehicle for testing and experiencing the LightABLE SR4 and SR12 transceiver modules.

Recognizing the need for a ready-made test bench for its line of transceiver modules, Reflex Photonics introduces a complete line of Optical Tester for BER measurements on the LightABLE™ SR4 and SR12 rugged embedded transceivers and optical interconnects.
Currently, Reflex Photonics offers these different optical test instruments:

Optical Tester SR4 40G (Enables BER measurement)
Optical Tester SR12 120G (Enables BER measurement)
Optical Generator/Tester SR12 120G (Generates PRBS and includes BERT capability)

The Reflex Photonics Optical Testers will speed up the LightABLE performance validation and confirm successful integration into your system as it enables BER and eye diagram tests over the SR4 and SR12 transceivers. In addition, those products will enable your communication system BER assessment.
The Optical Generator/Tester integrates a PRBS (pseudo random bit signal) generator and an embedded BER measurement capability. This instrument acts like a BERT as it will directly perform optical communication system BER assessment. It will also act as an optical cross-connect OXC.

Dr. Jocelyn Lauzon, V.P. Engineering at Reflex Photonics adds: 

These products offer an efficient, proven, and elegant ready-made solution that takes the guesswork out of testing performance and functionality of Reflex Photonics’ LightABLE.
Obviously, you can do the characterization of our transceiver, but if you replace the loopback cable by a bi-directional parallel optic communication system, the Optical Tester can be used to characterize the performance of a whole communication system. The communication bit rate and protocol can be changed, so the Optical Tester can be used to test different system architectures.

Reflex Photonics announces new operating temperature absolute rating on the LightABLE

LightABLE embedded transceiver

Reflex Photonics has proven that its LightABLE™ multichannel 120 Gbps* rugged optical transceivers can withstand temperature ranging between −55 ºC and 100 ºC, thus reaffirming Reflex Photonics commitment in delivering first-in-class optical modules for harsh environment applications. 
Reflex Photonics is relentlessly testing its line of LightABLE transceivers and constantly improving their ruggedness.

Guillaume Blanchette, product manager, says:

We are quite excited to announce that our LightABLE transceivers can withstand temperature ranging between −55 ºC and 100 ºC. This result reaffirms the reliability of the Reflex Photonics LightABLE transceivers and the suitability of these products for field deployment in harsh environments such as those found in military and space applications.

*: SR12 version

LightABLE embedded transceiver demonstrate their ruggedness with successful Accelerated Life Testing.

LightABLE LH product series being submitted to Accelerated Life Testing against MIL-STD-883J, method 1005, cond. D, June 2013.

Reflex Photonics is proud to announce that its LightABLE™ LH Series SR4 full-duplex 4 lane transceiver have proven they can withstand 2000 hours of “Lifetime Test” with no degradation of their performance. The successful completion of this industry-standard test is a first step in Reflex Photonics’ comprehensive space qualification program for its rugged transceivers.
A group of modules from the LightABLE LH product series were submitted to a “Lifetime Test” against MIL-STD-883J, method 1005, cond. D, June 2013. The test is conducted at a case temperature of 100 °C, 15 °C more than the recommended maximum operating temperature.
These units were tested against Reflex Photonics’ final production test procedure on all 8 channels, at different intervals, and at 3 different operating temperatures: −40 °C, 23 °C, and 85 °C. Even after 2000 hours of exposure to 100 °C temperatures, the LightABLE units maintained their high operational performance.

This result confirms the long-term reliability of the Reflex Photonics LightABLE transceivers and the suitability of these products for field deployment in harsh environments such as those found in military and space applications.
The LightABLE products are parallel optic interconnects operating at 10 Gbps per lane and offering the following features: small SWaP, operation over a large temperature range
(-40 °C to 85 °C), storage temperature from -57 °C to 125 °C. The LightABLE can be surface mounted or plugged on a board, and will support high temperature reflow process and operation with a link budget better than 13 dB.

Mr. Jocelyn Lauzon, Product Line Manager at Reflex Photonics adds:

When products are exposed to temperature stresses in the field, Accelerated Life Testing is used to simulate product life. In order to accelerate aging, products are tested at temperatures above that of their normal operating temperature.
Defects or failure that would only show up after many years in the field at normal operating temperatures can be detected in short times in an Accelerated Life Test.